Electron Lenses

The Horizon wide-format objective lens, combined with specially designed wafers, represents a first-of-its-kind advancement that enables researchers to customise their setups for a wide range of imaging requirements while significantly increasing throughput. By using wafers available in multiple configurations and orifice sizes, users can further tailor the system to match specific experimental needs. At the heart of this innovation is Horizon, the first wide-format objective lens designed to support wafer-level workflows within a TEM environment.

Aspect is our wide-sample pole-piece system, designed to enable large field-of-view imaging in Transmission Electron Microscopes (TEM). It allows users to examine broader sample areas without compromising resolution or performance. Aspect is ideal for applications requiring overview imaging, correlative workflows, or sample navigation, enhancing the efficiency of your TEM workflows with precision-engineered modularity.

Universal Adapter Platform (UAP) is designed to deliver unmatched flexibility in your TEM system. By enabling seamless integration of modular upgrades, the UAP allows researchers to adapt and expand their instrumentation without compromising performance or requiring system replacement. This platform supports custom configurations, experimental setups, making it a cornerstone of scalable, high-precision electron microscopy.

Bespoke Lens Solutions

Magnetic Simulation Design service provides advanced modeling and optimization of magnetic fields within TEM components. Using state-of-the-art simulation tools, we analyze and refine pole-piece geometries and magnetic circuits to enhance imaging performance, minimize aberrations, and ensure precise field control. This process is essential for developing custom solutions tailored to the unique requirements of modern electron microscopy applications.
Our Custom TEM Pole-piece solutions are tailored to meet the unique experimental and imaging needs of advanced electron microscopy. Whether your research requires magnetic field manipulation, environmental control, or high-resolution imaging under unique conditions, our custom designs ensure optimal performance without compromising the integrity of your TEM system.
Our Custom TEM Pole-piece solutions are tailored to meet the unique experimental and imaging needs of advanced electron microscopy. Whether your research requires magnetic field manipulation, environmental control, or high-resolution imaging under unique conditions, our custom designs ensure optimal performance without compromising the integrity of your TEM system.

From Concept to Impact

What We Do

We specialize in modular hardware and precision engineering services that expand the capabilities of existing Transmission Electron Microscopes.

Our Engineering Process

From concept to implementation, our engineering process is tailored to deliver optimized, functional, and tested solutions for your TEM system.

Case Studies

Discover real-world applications of our custom TEM upgrades and see how we’ve empowered our partners to break new scientific ground, without replacing their existing TEM system.